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Authors
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Heger, J.E. ; Chen, W. ; Zhong, H. ; Xiao, T. ; Harder, C. ; Apfelbeck, F.A.C. ; Weinzierl, A. ; Boldt, R. ; Schraa, L. ; Euchler, E. ; Sambale, A. K. ; Schneider, K. ; Schwartzkopf, M. ; Roth, S.V. ; Müller-Buschbaum, P.
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Title
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Superlattice deformation in quantum dot films on flexible substrates via uniaxial strain
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Date
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08.02.2023
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Number
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60191
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Abstract
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The superlattice in a quantum dot (QD) film on a flexible substrate deformed by uniaxial strain shows a phase transition in unit cell symmetry. With increasing uniaxial strain, the QD superlattice unit cell changes from tetragonal to cubic to tetragonal phase as measured with in situ grazing-incidence small-angle X-ray scattering (GISAXS). The respective changes in the optoelectronic coupling are probed with photoluminescence (PL) measurements. The PL emission intensity follows the phase transition due to the resulting changing inter-dot distances. The changes in PL intensity accompany a redshift in the emission spectrum, which agrees with the Förster resonance energy transfer (FRET) theory. The results are essential for a fundamental understanding of the impact of strain on the performance of flexible devices based on QD films, such as wearable electronics and next-generation solar cells on flexible substrates.
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Publisher
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Nanoscale Horizons
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Wikidata
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Citation
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Nanoscale Horizons 8 (2023) 383-395
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DOI
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https://doi.org/10.1039/D2NH00548D
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