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Authors
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Pompe, T.
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Title
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Line Tension Behavior of a First-Order Wetting System
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Date
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25.09.2002
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Number
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10431
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Abstract
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Line tension of hexaethylene glycol on a silicon wafer is measured with positive values up to +2.5×10-11···N below a contact angle of 6° and negative values down to -2×10-10···N above 6°, as expected for a first-order wetting system. From the measured interface potentials, a semiquantitative model function for the overall interface potential is derived as a superposition of a constant nonretarded van der Waals interaction with a Hamaker constant of -2.6×10-19···J and an exponentially decaying term, allowing the prediction of a finite positive line tension at the wetting transition.
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Publisher
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Physical Review Letters
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Wikidata
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Citation
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Physical Review Letters 89 (2002) 076102-1 - 076102-4
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DOI
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https://doi.org/10.1103/PhysRevLett.89.076102
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Tags
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