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Title Three-Phase Contact Line Energetics from Nanoscale Liquid Surface Topographies
Date 20.08.2000
Number 9420
Abstract The contact line tension of a three-phase system (solid-liquid-vapor) is determined from the liquid surface topography data obtained with scanning force microscopy. The data are analyzed in two completely complementary ways, one of which is based on the modified Young equation, the other on the effective interface potential derived from the profile of the liquid-vapor interface in the three-phase region. The two methods agree quite well for the systems investigated. Contact line tensions are in the range of 10(-11) to 10(-10) J/m, which is consistent with theory.
Publisher Physical Review Letters
Identifier Q52105779
Citation Physical Review Letters 85 (2000) 1930-1933
DOI https://doi.org/10.1103/PHYSREVLETT.85.1930
Authors Pompe, T. ; Herminghaus, S.
Tags - scanning force microscopy drop size dependence nanometer resolution tension angles

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