Title Suppression of Roughness Replication in Bilayer Films Prepared by Spin-Coating
Date 14.02.2000
Number 8999
Abstract Utilizing the high resolution of a reflection ultrasmall-angle scattering setup, the roughnessreplication in polymer single-layer and bilayer samples is probed. Single films of fully brominatedpolystyrene (PBrS) as well as bilayer films of polystyrene on top of PBrS and of PBrS on top of polyamide-6I are investigated. Three different methods are presented to suppress the replication: the use of thickfilms, the use of films of laterally heterogeneous thickness, and the preparation from a solvent such thatthe polymer has only a weak interaction with the substrate. For single-layer samples of PBrS withincreasing film thickness, the long-range correlation is decreased. Conformal roughness was detected upto a film thickness of 18<I>R</I><SUB>g</SUB> (1349 &Aring;). At a film thickness of 26<I>R</I><SUB>g</SUB> (1989 &Aring;), an individual scattering of theinterfaces was observed. Irrespective of the roughness replication behavior of the individual sublayers,the methods presented are able to suppress the constraint of a morphology replication in bilayer films.
Publisher Macromolecules
Citation Macromolecules 33 (2000) 569-576
Authors Müller-Buschbaum, P. ; Gutmann, J.S. ; Kraus, J. ; Walter, H. ; Stamm, M.
Tags thin polymer-films x-ray-scattering interfaces

Back to list