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Authors
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Affrossman, S. ; Jerome, R. ; O'Neill, S.A. ; Schmitt, T. ; Stamm, M.
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Title
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Surface structure of thin film blends of polystyrene and poly(n-butyl methacrylate)
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Date
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19.12.2000
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Number
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9653
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Abstract
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Thin films of blends of polystyrene (PS) and poly(n-butyl methacrylate) (PBMA) were prepared by spin-casting onto silicon wafers in order to map the lateral distribution of the two polymers. The surfaces were examined by atomic force microscopy (AFM) secondary ion mass spectroscopy X-ray photoelectron spectroscopy (XPS) and photoemission electron microscopy (PEEM). Films with PBMA contents of 50% w/w or less were relatively smooth, but further increase in the PBMA content produced, initially, protruding PS ribbons and then, for PBMA S80% w/w, isolated PS islands. At all concentrations the topmost surface (0.5-1.0 nm) was covered by PBMA, whilst the PBMA concentration in the near-surface region, measured by XPS, increased with bulk content to eventual saturation. PEEM measurements of a PS-PBMA film at the composition at which ribbon features were observed by AFM also showed a PS-rich ribbon structure surrounded by a sea of mainly PBMA.
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Publisher
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Colloid and Polymer Science
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Wikidata
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Citation
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Colloid and Polymer Science 278 (2000) 993-999
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DOI
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https://doi.org/10.1007/s003960000358
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Tags
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key words polymer blends · thin films · topography · polystyrene incompatible polymers topography
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