Authors Chang, B. ; Schneider, K. ; Patil, N. ; Roth, S. ; Heinrich, G.
Title Microstructure characterization in a single isotactic polypropylene spherulite by synchrotron microfocus wide angle X-ray scattering
Date 25.04.2018
Number 55244
Abstract Position-resolved microstructure in a single spherulite of iPP is quantitatively studied by synchrotron microfocus wide angle X-ray scattering. The results show that the normal of mother lamellae in a spherulite is aligned mainly perpendicular to the radius, and the subsidiary daughter lamellae are inclined 80.75° with respect to that of the dominant mother lamellae. The crystallinity in the spherulite is in the range of 46%–56%, which is rarely influenced by the crystallization temperature. The ratio between the daughter lamellae and the mother lamellae is 0.18 when iPP crystallizes at 138·°C and it decreases to 0.11 as the crystallization temperature is decreased to 130·°C. The b-axis and c-axis in the mother lamellae tend to orient perpendicular to the radius direction, and the a-axis prefers to align in the radius direction.
Publisher Polymer
Citation Polymer 142 (2018) 387-393
Tags synchrotron wide angle x-ray scattering spherulite

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