Departments > Nanostructured Materials > Equipment > X-ray Lab

X-ray Lab

1. SAXS / WAXS

(Scattering methods for structure determination on different lengths scales in bulk, fibers and melt)

SAXS ... Small Angle X-ray Scattering
WAXS ... Wide Angle X-ray Scattering

4-circle diffractometer P4

4-circle diffractometer P4
(BRUKER-AXS, Karlsruhe) with:

  • area detection system HiStar / GADDS
    and graphite monochromator
    (Siemens Analytical, Madison / WI)
  • oven up to 300 °C, inert gas floating
    (own construction)

KRATKY compact camera

KRATKY compact camera
(HECUS, Graz) with:

  • linear detector PSD-50m
    (M. BRAUN, Garching)
  • temperature equipment up to 300 °C,
    inert gas floating
    (own construction)

2. GID / XR

(Scattering methods with grazing incidence for structure determination on different lengths scales in films and thin layers)

GID ... Grazing Incidence Diffraction
XR ... X-ray Reflectometry

2-circle diffractometer XRD 3003 T/T

2-circle diffractometer XRD 3003 T/T
(GE Inspection Technologies /
Seifert-FPM, Freiberg) with:

  • reflectometry equipment (z-table, knife)
  • crystal and multilayer monochromators
  • temperature chamber XRK,
    vacuum or inert gas floating
    (Anton Paar, Graz),

For further information please contact:

Dr. Dieter Jehnichen

+49 (0) 351 4658-493

Torsten Hofmann

+49 (0) 351 4658-377

 
X-ray Lab
X-ray Lab

Departments

Nanostructured Materials

Equipment