Departments > Nanostructured Materials > Equipment > AFM Lab

Scanning Force Microscopy

DI / Veeco

  • with NanoScope IIIa - Controller: Multimode, Dimension 3100, BioScope
  • with NanoScope IV - Controller: Dimension 3100

all instruments:
  • contact mode, tapping mode, (non-contact mode)
  • friction force microscopy
  • phase imaging
  • electric/magnetic field gradient microscopy
  • surface potential microscopy
  • imaging in liquids
  • force-distance curve, force volume

 

Multimode only:
  • heating stage (250° C)
  • environmental hood (gases, RH 0....96%)
  • force modulation microscopy

 

Dimension only:
  • nanoindentation, nanoscratching

Asylum Research MFP-3D

  • contact mode, tapping mode, (non-contact mode)
  • friction force microscopy
  • phase imaging
  • electric/magnetic field gradient microscopy
  • imaging in liquids
  • force-distance curve, force volume
  • lithography
  • nanomanipulation
  • electrical conductivity imaging / I-V curves (pA)
  • cooling/heating stage

For further information please contact:

Andreas Janke

+49 (0) 351 4658-496

 
AFM Lab
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Nanostructured Materials

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