|
Authors
|
Müller-Buschbaum, P. ; Gutmann, J.S. ; Kraus, J. ; Walter, H. ; Stamm, M.
|
|
Title
|
Suppression of Roughness Replication in Bilayer Films Prepared by Spin-Coating
|
|
Date
|
14.02.2000
|
|
Number
|
8999
|
|
Abstract
|
Utilizing the high resolution of a reflection ultrasmall-angle scattering setup, the roughnessreplication in polymer single-layer and bilayer samples is probed. Single films of fully brominatedpolystyrene (PBrS) as well as bilayer films of polystyrene on top of PBrS and of PBrS on top of polyamide-6I are investigated. Three different methods are presented to suppress the replication: the use of thickfilms, the use of films of laterally heterogeneous thickness, and the preparation from a solvent such thatthe polymer has only a weak interaction with the substrate. For single-layer samples of PBrS withincreasing film thickness, the long-range correlation is decreased. Conformal roughness was detected upto a film thickness of 18<I>R</I><SUB>g</SUB> (1349 Å). At a film thickness of 26<I>R</I><SUB>g</SUB> (1989 Å), an individual scattering of theinterfaces was observed. Irrespective of the roughness replication behavior of the individual sublayers,the methods presented are able to suppress the constraint of a morphology replication in bilayer films.
|
|
Publisher
|
Macromolecules
|
|
Wikidata
|
Q61927181
|
|
Citation
|
Macromolecules 33 (2000) 569-576
|
|
DOI
|
https://doi.org/10.1021/MA9902551
|
|
Tags
|
thin polymer-films x-ray-scattering interfaces
|
