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Mar 22: Dr. Wojciech Ogieglo, Swellipsometry and tellipsometry: In-situ spectroscopic ellipsometry for studies of thin polymer films and membranes
Dr. Wojciech Ogieglo
DWI Leibniz Institute for Interactive Materials, Aachen
Title: "Swellipsometry and tellipsometry: In-situ spectroscopic ellipsometry for studies of thin polymer films and membranes"
March 22, 2016, 13:00, Konferenzsaal
22.03.2016