Authors Müller-Buschbaum, P. ; Gutmann, J.S. ; Wolkenhauer, M. ; Kraus, J. ; Stamm, M. ; Smilgies, D. ; Petry, W.
Title Solvent-Induced Surface Morphology of Thin Polymer Films
Date 05.03.2001
Number 9841
Abstract With specular and off-specular X-ray scattering the surface morphology in terms of surfaceroughness, film quality, and roughness correlation in thin polymer films of polystyrene and fullybrominated polystyrene is measured. During the preparation of the thin films on top of silicon substrates,the common solvent was varied. We investigated eight different solvents and three different solventmixtures to depict the influence of typical solvent parameters. In the regime of a small solvent vaporpressure, we observed correlated roughness as the ultimate lower limit of accessible surface smoothness.The resulting films are homogeneous, and the surface roughness is given by the substrate. In anintermediate vapor pressure regime marked surface morphologies are detected, while at a high vaporpressure smoother films result again.
Publisher Macromolecules
Wikidata Q61982743
Citation Macromolecules 34 (2001) 1369-1375
Tags x-ray-scattering correlated roughness molecular-weight multilayers polystyrene reflection interfaces mixtures layers

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