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Authors
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Müller-Buschbaum, P. ; Gutmann, J.S. ; Kraus, J. ; Walter, H. ; Stamm, M.
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Title
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Suppression of Roughness Replication in Bilayer Films Prepared by Spin-Coating
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Date
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14.02.2000
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Abstract
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Utilizing the high resolution of a reflection ultrasmall-angle scattering setup, the roughnessreplication in polymer single-layer and bilayer samples is probed. Single films of fully brominatedpolystyrene (PBrS) as well as bilayer films of polystyrene on top of PBrS and of PBrS on top of polyamide-6I are investigated. Three different methods are presented to suppress the replication: the use of thickfilms, the use of films of laterally heterogeneous thickness, and the preparation from a solvent such thatthe polymer has only a weak interaction with the substrate. For single-layer samples of PBrS withincreasing film thickness, the long-range correlation is decreased. Conformal roughness was detected upto a film thickness of 18<I>R</I><SUB>g</SUB> (1349 Å). At a film thickness of 26<I>R</I><SUB>g</SUB> (1989 Å), an individual scattering of theinterfaces was observed. Irrespective of the roughness replication behavior of the individual sublayers,the methods presented are able to suppress the constraint of a morphology replication in bilayer films.
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Journal
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Macromolecules 33 (2000) 569-576
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DOI
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https://doi.org/10.1021/MA9902551
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