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Authors
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Henneberg, O. ; Geue, Th. ; Pietsch, U. ; Saphiannikova, M. ; Chi, L. F. ; Rochon, P. ; Natansohn, A. L.
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Title
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Atomic force microscopy inspection of the early state of formation of polymer surface relief gratings
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Date
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08.10.2001
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Number
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401
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Abstract
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The process of surface relief grating formation was inspected by atomic force microscopy after short-pulse exposure with counter-rotating circularly polarized laser light of 488 nm on a polymer film containing an azobenzene side-chain homopolymer (pDR1M, TG = 129 °C). During light inscription, the grating formation was probed by time-resolved visible scattering with red laser light. The efficiency of grating formation depends on the pulse length of blue light exposure. The shortest pulse length of 2 s did not create a permanent surface relief. After 5 s, a speckled surface modification starts rising and the surface relief becomes more and more uniform with a sinusoidal shape for longer exposure. The experimental findings reveal the individual addressing of azobenzene side groups by the actinic light providing a local lateral force via molecular trans-cis and cis-trans isomerization which subsequently causes grating formation. ©2001 American Institute of Physics.
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Publisher
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Applied Physics Letters
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Wikidata
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Citation
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Applied Physics Letters 79 (2001) 2357-2359
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DOI
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https://doi.org/10.1063/1.1409584
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Tags
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