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Authors
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Mapesa, E. U. ; Erber, M. ; Tress, M. ; Eichhorn, K.-J. ; Serghei, A. ; Voit, B. ; Kremer, F.
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Title
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Glassy dynamics in nanometer thin layers of polystyrene
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Date
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24.11.2010
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Abstract
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Broadband Dielectric Spectroscopy (BDS) and Ellipsometry are combined to study the glassy dynamics of nanometric layers (>= 5 nm) of polystyrene. For the former, two types of sample arrangement are applied, that is, the conventional method where evaporated metal electrodes are used and a novel technique in which insulating silica nanostructures serve as spacers between highly conducting doped silicon counter electrodes. Within the limits of the experimental accuracy (+- 2 K) both approaches, BDS and Ellipsometry, deliver the coinciding result that - compared to the bulk - the glassy dynamics is not shifted. Furthermore the dielectric measurements do not indicate any broadening of the relaxation time distribution function, independent of the sample geometry employed.
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Journal
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European Physical Journal Special Topics 189 (2010) 173-180
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DOI
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https://doi.org/epjst/e2010-01320-2
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