Authors Mapesa, E. U. ; Erber, M. ; Tress, M. ; Eichhorn, K.-J. ; Serghei, A. ; Voit, B. ; Kremer, F.
Title Glassy dynamics in nanometer thin layers of polystyrene
Date 24.11.2010
Number 26022
Abstract Broadband Dielectric Spectroscopy (BDS) and Ellipsometry are combined to study the glassy dynamics of nanometric layers (>= 5 nm) of polystyrene. For the former, two types of sample arrangement are applied, that is, the conventional method where evaporated metal electrodes are used and a novel technique in which insulating silica nanostructures serve as spacers between highly conducting doped silicon counter electrodes. Within the limits of the experimental accuracy (+- 2 K) both approaches, BDS and Ellipsometry, deliver the coinciding result that - compared to the bulk - the glassy dynamics is not shifted. Furthermore the dielectric measurements do not indicate any broadening of the relaxation time distribution function, independent of the sample geometry employed.
Publisher European Physical Journal Special Topics
Citation European Physical Journal Special Topics 189 (2010) 173-180
Tags ultrathin polymer-films transition temperature dielectric relaxations surface interface viscosity mobility scale oxide heat

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