Authors
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Usov, D. ; Sheparovych, R. ; Scholl, A. ; Doran, A. ; Stamm, M. ; Minko, S.
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Title
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Study of Switching of Top Layer Composition of Mixed Polymer Brushes with X-ray Photoemission Electron Microscopy
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Date
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01.09.2004
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Number
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12531
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Abstract
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We investigate switching and phase segregation of mixed polymer brushes. X-ray Photoemission Electron Microscopy (XPEEM) is a powerful tool for direct sensing of local chemical composition of top layers of thin heterogeneous polymer films. Near Edge X-ray Absorption Fine Structure (NEXAFS) is used in the method to study the chemical contrast between surface features. However, procedures for quantitative chemical analysis are not well developed for XPEEM in contrast to other techniques based on X-ray induced photoeffects. In order to estimate the probable mistake, we have compared the XPEEM results on average top layer composition of poly(styrene-co-2,3,4,5,6-pentafluorostyrene)/poly(methyl methacrylate) brushes after exposure to three different solvents of various selectivity with the data obtained using X-ray Photoelectron Spectroscopy (XPS). These two techniques provided similar quantitative results proving correctness of the proposed treatment procedure of the NEXAFS spectra recorded in the XPEEM experiment.<br /><br />Joint PMSE/POLY Poster Session: General Papers/New Concepts in Polymeric Materials<br />The 227th ACS National Meeting, Anaheim, CA, March 28-April 1, 2004
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Publisher
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Polymeric Materials: Science and Engineering
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Wikidata
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Citation
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Polymeric Materials: Science and Engineering 90 (2004) 626-627
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DOI
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http://oasys2.confex.com/acs/227nm/techprogram/P719836.HTM
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