News
Time-of-flight secondary ion mass spectrometry (ToF-SIMS) reference spectra of Teflon™ AF published in Surface Science Spectra
Ralf Zimmerman and Mirko Nitschke published ToF-SIMS reference spectra for Teflon™ AF, a fluoropolymer with applications in optoelectronics, surface engineering, and electrowetting.
The spectral features uncovered in this study can be used to identify Teflon™ AF in multi-layer architectures, e.g. in micro and nanofluidic systems, to classify materials using machine learning algorithms, and for quality control.
The article can be accessed at https://doi.org/10.1116/6.0005451 and was featured in Scilights by the editors of the journal.
23.06.2026