Publikationsliste
| Authors | Bittrich, E. ; Eichhorn, K.-J. |
|---|---|
| Title |
Application of spectroscopic ellipsometry in the analysis of thin polymer films/polymer interfaces
Polymer Surface Characterization, Sabbatini, L., De Giglio, E., ed. |
| Date | 06.10.2022 |
| Number | 60163 |
| Abstract | Spectroscopic ellipsometry (SE), as a noninvasive technique, is well placed for the investigation of organic films and interfaces containing polymers. In an ellipsometric measurement, the change in the polarization state of light upon interaction with a material is detected. Spectroscopic investigations from the ultraviolet (UV) to the infrared (IR) and further to the terahertz (THz) range are possible [1–3], providing a profound set of data for the analysis of polymer film dielectric function and thickness. |
| Publisher | De Gruyter |
| Wikidata | |
| Citation | De Gruyter 2nd edition (2022) 281-322 |
| DOI | https://doi.org/10.1515/9783110701098-008 |
| Tags |