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Authors
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Roodenko, K. ; Mikhailova, Y. ; Ionov, L. ; Gensch, M. ; Stamm, M. ; Minko, S. ; Schade, U. ; Eichhorn, K.-J. ; Esser, N. ; Hinrichs, K.
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Title
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Ultrathin responsive polyelectrolyte brushes studied by infrared synchrotron mapping ellipsometry
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Date
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28.03.2008
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Number
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15043
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Abstract
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An infrared microfocus spectroscopic mapping ellipsometer was set up at the Berlin electron synchrotron storage ring and used to study ultrathin polyacrylic acid brush films with 3 nm thickness. The pH-responsive properties of the brush on a gold-coated glass substrate were investigated. The chemical structure of the brush was resolved with a spatial resolution of 300 µm using the synchrotron mapping ellipsometer. ©2008 American Institute of Physics
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Publisher
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Applied Physics Letters
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Wikidata
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Citation
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Applied Physics Letters 92 (2008) 103102 (3 pp.)
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DOI
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https://doi.org/10.1063/1.2892132
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Tags
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chemical structure ellipsometry infrared spectra ph polymer films pacs:61.66.hq - crystal structure of specific organic compounds 61.41.+e - structure of polymers elastomers and plastics 68.55.j- thin film morphology 78.30.jw infrared and raman spectra in
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