|
Authors
|
Zimmermann, R.; Nitschke, M.
|
|
Title
|
Time-of-flight secondary ion mass spectrometry reference spectra of polymer coatings: Teflon™ AF 1601 in positive and negative polarity
|
|
Date
|
05.06.2026
|
|
Number
|
0
|
|
Abstract
|
Polymer coatings with tailored properties have enabled advances and innovations in industry, biomedicine, sensorics, and consumer goods. The optimization of the functionality and the development of new applications require the comprehensive characterization of the material properties. Along with other methods, time-of-flight secondary ion mass spectrometry is applied for this purpose. Here, we provide reference spectra for Teflon™ AF 1601, a soluble, amorphous fluoropolymer with applications in innovative fields such as opto-electronics, microfluidics, and sensorics. Spectra were measured with positive and negative polarity using a 30 kV Bi++3 primary ion beam.
|
|
Publisher
|
American Institute of Physics
|
|
Wikidata
|
|
|
Citation
|
Surface Science Spectra 33 (2026) 015003
|
|
DOI
|
https://doi.org/10.1116/6.0005451
|
|
Tags
|
|
