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Authors Hinrichs, K. ; Eichhorn, K.-J.
Title Ellipsometry of Functional Organic Surfaces and Thin Films. - 2nd Edition
Springer Series in Surface Sciences, Hinrichs, K.; Eichhorn, K.-J., ed.
Date 04.04.2018
Number 54350
Abstract This new edition provides a state-of-the-art survey of ellipsometric methods used to study organic films and surfaces, from laboratory to synchrotron applications, with a special focus on in-situ use in processing environments and at solid-liquid interfaces. Thanks to the development of functional organic, meta- and hybrid materials for new optical, electronic, sensing and biotechnological devices, the ellipsometric analysis of optical and material properties has made tremendous strides over the past few years.<br />The second edition has been updated to reflect the latest advances in ellipsometric methods. The new content focuses on the study of anisotropic materials, conjugated polymers, polarons, self-assembled monolayers, industrial membranes, adsorption of proteins, enzymes and RGD-peptides, as well as the correlation of ellipsometric spectra to structure and molecular interactions.<br /><br />ISBN 978-3319758947
Publisher Springer
Wikidata
Citation Springer Series in Surface Sciences 2nd ed. (2018) 551 Seiten
DOI http://www.springer.com/de/book/9783319758947
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