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BRUKER Avance 300

Installation 2002; magnet 1993

  • widebore magnet
  • solid state NMR
  • three rf channels
  • microimaging accessory

Solids probes

  • MAS probe (2.5mm) 19F-1H
  • MAS probe (4 mm) 1H / 19F; 15N - 31P temperature range -150 0C to +300 0
  • MAS probe (7 mm) H - X
  • static wideline probe

Imaging probes

  • micro 2.5, three orthogonal gradients, maximum gradient strength: 1T/m
  • diffusion probe with quadrupole gradient coil (in-house built)
  • electrophoresis NMR system (in-house built)
  • rheo NMR kit

BRUKER Avance 500

 Installation 2002

  • widebore ultrashield magnet
  • solid-state NMR
  • three rf channels
  • microimaging accessory

Solids probes

  • MAS probe 1.3 mm H - F - X
  • MAS probe 1.9 mm H - X - Y
  • MAS probe 2.5 mm H - F - X
  • MAS probe 4 mm H - X - Y 
  • MAS probe 3.2 mm H - X - Y with gradient

Imaging probes

  • diffusion probe, Diff 30, uniaxial gradient 12 T/m maximum
  • diffusion probe, Diff 60
  • electrophoresis NMR probe (in-house built) H - X

Tecmag

Tecmag Appollo & Tecmag LapNMR

  • used with in-house built Halbach magnets typically operating at 30 MHz
  • measurement of relaxation times and residual dipolar couplings to access polymer dynamics
  • combined with an in-house built stress-strain experiment for the in-situ investigation of the effect of mechanical stress on the polymer dynamics

Electron Microscopy

Transmission Electron Microscope Libra200

  • Field Emission Gun
  • Gun Monochromator
  • In-Column Omega-Type Energy Filter
  • HAADF Detector

TEM Resolution 0.2 nm, STEM Resolution ~1 nm,
Energy resolution ~0.2 eV

For further information please contact:
Petr Formanek (for scientific usage of TEM)
Uta Reuter (for operation of TEM)

Transmission Electron Microscope Libra120

  • LaB6 Gun
  • In-Column Omega-TypeEnergy Filter
  • Cryo-Transfer System

TEM Resolution 0.4 nm Energy resolution ~1.5 eV

For further information please contact:
Petr Formanek (for scientific usage of TEM)
Uta Reuter (for operation of TEM)

Scanning Electron Microscope / Focused Ion Beam NEON40

SEM: Field Emission Gun
SEM resolution: ~ 1 nm

FIB: Ga+ Ion Gun
FIB resolution: ~ 15 nm
Minimum milled line width: ~ 100 nm
Back-Scattered Electrons Detector
Cryo-Transfer System

For further information please contact:
Petr Formanek (for scientific usage of SEM/FIB)
Michael Göbel (for operation of SEM/FIB)

Grid Plunger Leica EM GP for Cryo-TEM

Shock-freezing device for preparing frozen liquid thin films for TEM.
The TEM grid can equilibrate in an environmental chamber with humidity regulation and temperature range 4 °C to 60 °C.

For further information please contact:
Petr Formanek

Ultramicrotomes UC6/UC7

The ultramicrotome is used for preparing ultrathin sections of bulk specimens for TEM, at room temperature (UC6) or low temperatures (UC7).

For further information please contact:
Uta Reuter

Milling Cutter

The milling cutter is used for trimming of bulk specimens for ultramicrotomy.

For further information please contact:
Uta Reuter