Authors
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Gutmann, J.S. ; Müller-Buschbaum, P. ; Schubert, D.W. ; Stribeck, N. ; Smilgies, D. ; Stamm, M.
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Title
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Roughness correlations in ultra-thin polymer blends films
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Date
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31.12.2000
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Number
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9721
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Abstract
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Ultra-thin films of weakly incompatible polymer blends form smooth films with correlated interfaces upon suitable preparation. With the poly-(styrene-co-para-bromo-styrene) PBr<sub>0.91</sub>S/PBr<sub>0.67</sub>S blend system, of slightly different degrees of bromination, a series of samples with varying composition on top of roughened substrates has been investigated. The surface morphology of the thin films was characterized by microscopy measurements, while with diffuse X-ray scattering the roughness correlation between the interfaces was examined. A lower cut-off length of the replicated roughness spectrum at small dimensions was obtained. Our results show, that the blend composition has a distinct influence on the replicated in-plane lengths.
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Publisher
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Physica / B
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Wikidata
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Citation
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Physica / B 283 (2000) 40-44
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DOI
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https://doi.org/10.1016/S0921-4526(99)01888-8
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Tags
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polymers ultra-thin films roughness correlations scattering 83.30.es 61.10.kw 61.10.eq 68.55.-a phase-separation polystyrene topography mixtures
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