Menue

ELECTRON MICROSCOPY

Dr. Petr Formánek

Contact Electron Microscopy
at the Leibniz-Institut für Polymerforschung Dresden e.V.

Hohe Strasse 6
01060 Dresden
Phone: +49 (0)351 4658-777
Fax: +49 (0)351 4658-281
Email: formanek@ipfdd.de

 

 

Methode members

  • Michael Göbel
  • Uta Reuter

Research Topics

The electron microscopy is an indispensable tool for today's material characterization. It provides enormous amount of information on morphology, structure and chemical composition of novel materials and composites and thus electron microscopy is a key factor that makes the progress in materials research possible. We provide:

  • in-house service for material characterization by transmission electron microscopy (TEM)
  • developing TEM techniques and specimen preparation methods
  • specimen preparation by ultramicrotomy and by focussed ion beam (FIB) lift-out
  • energy-filtered TEM and energy electron loss spectroscopy (EELS)
  • energy-dispersive X-ray spectroscopy (EDX)
  • cryogenic electron microscopy (cryo-TEM, cryo-SEM, cryo-FIB)

Equipment

Transmission Electron Microscope Libra200

  • Field Emission Gun
  • Gun Monochromator
  • In-Column Omega-Type Energy Filter
  • HAADF Detector

TEM Resolution 0.2 nm, STEM Resolution ~1 nm,
Energy resolution ~0.2 eV

For further information please contact:
Petr Formanek (for scientific usage of TEM)
Uta Reuter (for operation of TEM)

Transmission Electron Microscope Libra120

  • LaB6 Gun
  • In-Column Omega-TypeEnergy Filter
  • Cryo-Transfer System

TEM Resolution 0.4 nm Energy resolution ~1.5 eV

For further information please contact:
Petr Formanek (for scientific usage of TEM)
Uta Reuter (for operation of TEM)

Scanning Electron Microscope / Focused Ion Beam NEON40

SEM: Field Emission Gun
SEM resolution: ~ 1 nm

FIB: Ga+ Ion Gun
FIB resolution: ~ 15 nm
Minimum milled line width: ~ 100 nm
Back-Scattered Electrons Detector
Cryo-Transfer System

For further information please contact:
Petr Formanek (for scientific usage of SEM/FIB)
Michael Göbel (for operation of SEM/FIB)

Sputter Coater SCD500

Sputtering of Pt, Si, Cr, W
Carbon Thread Evaporation
Plasma Etching
Cryo-Transfer System for Sputtering with Platinum
Quarz for sputtered layer thickness monitoring

For further information please contact:
Michael Göbel

Sputter Coater SCD050

Sputtering of gold layers

For further information please contact:
Andreas Janke

Grid Plunger for Cryo-TEM

Shock-freezing device for preparing frozen liquid thin films for TEM.
The TEM grid can equilibrate in an environmental chamber with humidity regulation and temperature range 4 °C to 60 °C.

For further information please contact:
Petr Formanek

Plasma Chamber

Oxygen plasma for hydrophilisation of surfaces.

For further information please contact:
Michael Göbel

Milling Cutter

The milling cutter is used for trimming of bulk specimens for ultramicrotomy.

For further information please contact:
Uta Reuter

Ultramicrotomes UC6/UC7

The ultramicrotome is used for preparing ultrathin sections of bulk specimens for TEM, at room temperature (UC6) or low temperatures (UC7).

For further information please contact:
Uta Reuter

Other Scanning Electron Microscopes at IPF

FEI Phenom, table-top easy-to-use SEM.
Responsible: Andreas Janke

Zeiss Ultra Plus with transmitted electrons detector and 4-quadrant EDX detector.
Responsible: Maria Auf der Landwehr

Zeiss Gemini DSM 982, low-voltage SEM with Electron Beam Lithography unit.
Group of Dr. Hans-Georg Braun

FEI XL30, Environmental SEM with EDX detector
at Max-Bergmann Center

Collaborations

  • Institut für Angewandte Photophysik (TU Dresden)

5 most important publications

  • Guenther, A. A.; Sawatzki, M.; Formanek, P.; Kasemann, D.; Leo, K., Advanced Functional Materials 2016, 26 (5), 768-775.
  • Sanwaria, S.; Singh, S.; Horechyy, A.; Formanek, P.; Stamm, M.; Srivastava, R.; Nandan, B., RSC Advances 2015, 5, 89861-89868.
  • Herrmann, A.-K.; Formanek, P.; Borchardt, L.; Klose, M.; Giebeler, L.; Eckert, J.; Kaskel, S.; Gaponik, N.; Eychmüller, A., Chem. Mater. 2014, 26 (2), 1074-1083.
  • Kolesov, I.; Dolynchuk, O.; Jehnichen, D.; Reuter, U.; Stamm, M.; Radusch, H. J., Macromolecules 2015, 48, 4438-4450.
  • Agarwal, M.; Choudhury, S.; Gruber, K.; Simon, F.; Fischer, D.; Albracht, V.; Göbel, M.; Koller, S.; Stamm, M.; Ionov, L., Journal of Power Sources 2014, 261, 363-370.