Roodenko, K. ; Mikhailova, Y. ; Ionov, L. ; Gensch, M. ; Stamm, M. ; Minko, S. ; Schade, U. ; Eichhorn, K.-J. ; Esser, N. ; Hinrichs, K.
Ultrathin responsive polyelectrolyte brushes studied by infrared synchrotron mapping ellipsometry
An infrared microfocus spectroscopic mapping ellipsometer was set up at the Berlin electron synchrotron storage ring and used to study ultrathin polyacrylic acid brush films with 3 nm thickness. The pH-responsive properties of the brush on a gold-coated glass substrate were investigated. The chemical structure of the brush was resolved with a spatial resolution of 300 µm using the synchrotron mapping ellipsometer. ©2008 American Institute of Physics
Source
Applied Physics Letters 92
Pages
103102 (3 pp.)
DOI
http://dx.doi.org/10.1063/1.2892132
Published
March 2008
Ultrathin responsive polyelectrolyte brushes studied by infrared synchrotron mapping ellipsometry
An infrared microfocus spectroscopic mapping ellipsometer was set up at the Berlin electron synchrotron storage ring and used to study ultrathin polyacrylic acid brush films with 3 nm thickness. The pH-responsive properties of the brush on a gold-coated glass substrate were investigated. The chemical structure of the brush was resolved with a spatial resolution of 300 µm using the synchrotron mapping ellipsometer. ©2008 American Institute of Physics
Source
Applied Physics Letters 92
Pages
103102 (3 pp.)
DOI
http://dx.doi.org/10.1063/1.2892132
Published
March 2008
