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Beyerlein, D. ; Eichhorn, K.-J. ; Kratzmüller, Th.
Study of Novel Polymer Architecture on Solid Surfaces by Variable Angle Spectroscopic and Imaging Ellipsometry

Polymers are often applied as thin layers on different substrates. So ellipsometry is used to characterize the thickness and the optical constants. Unfortunately this method is model-based and novel polymer architectures require suitable optical models. This paper shows a simple way to detect thickness and optical constants in the region of the absorption for a multilayer system of polycations and dyes. Sometimes the lateral inhomogeneity of polymer layers prevents a correct estimation of the thickness. The imaging ellipsometry permits to image the inhomogeneities or microstructures. Furthermore, the thickness can be determined in regions of interest. This method is demonstrated on mictrostructured surface-polymerized polypeptides.

Quelle
Vibrational Spectroscopy 29

Seiten
223-227

DOI
http://dx.doi.org/10.1016/S0924-2031(01)00175-8

Erschienen am
June 2002
 
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