Jehnichen, D. ; Pohlers, A. ; Zafeiropoulos, N.E. ; Kummer, S. ; Schneider, K. ; Lehmann, D. ; Stamm, M. ; Roth, S. ; Burghammer, M. ; Riekel, C.
Scanning X-ray microscopy for polymer applications



Source
The Europan Synchrotron Radiation Facility

Pages


DOI


Published
December 2002