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Pleul, D. ; Simon, F.
Time-of-flight seconfary ion mass spectrometry
in: Polymer Surfaces and Interfaces : Characterization, Modification and Applications, Stamm, M., ed.

Static secondary ion mass spectrometry provides information on the molecular composition of the topmost layer of a sample. It is mostly used as a complementary technique to determine surface composition, surface contamination or surface segregation of components. The time-of-flight technique enables high mass resolution also at the higher mass values needed for polymers.

About the book
Polymers are one of industry’s most vital substances. In what is an extremely practical and applicable new work, experts provide concise explanations, with examples and illustrations, of the key techniques in this important field.
In each case, after basic principles have been reviewed, applications of the experimental techniques are discussed and illustrated with specific examples.
Readers from a huge variety of relevant fields will thus benefit from an application-oriented book that helps them to find solutions to both fundamental and applied problems.
Those who are familiar with these versatile compounds will know that the surfaces and interfaces of polymers play an important role in most of the application areas of polymers.
These applications stretch from moulds, foils, and composites, to biomaterials and applications in micro- and nanotechnology.
Therefore it is very important to be able to characterize these surfaces and interfaces in detail – something that Stamm has achieved with real style.

ISBN 978-3-540-73864-0

Springer Chapter 5



March 2008


Polymer Interfaces