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Roodenko, K. ; Mikhailova, Y. ; Ionov, L. ; Gensch, M. ; Stamm, M. ; Minko, S. ; Schade, U. ; Eichhorn, K.-J. ; Esser, N. ; Hinrichs, K.
Ultrathin responsive polyelectrolyte brushes studied by infrared synchrotron mapping ellipsometry

An infrared microfocus spectroscopic mapping ellipsometer was set up at the Berlin electron synchrotron storage ring and used to study ultrathin polyacrylic acid brush films with 3  nm thickness. The pH-responsive properties of the brush on a gold-coated glass substrate were investigated. The chemical structure of the brush was resolved with a spatial resolution of 300  µm using the synchrotron mapping ellipsometer. ©2008 American Institute of Physics

Quelle
Applied Physics Letters 92

Seiten
103102 (3 pp.)

DOI
http://dx.doi.org/10.1063/1.2892132

Erschienen am
March 2008
 
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