polymer analysis (bulk material) and surface / buried interface characterization (thin films, layered and laterally correlated structures) on different length scales
characterization of isotropic material (powder) and oriented (textured) samples (fibers, plates, tensile test samples)
phase morphology of standard polymers (crystallinity, crystalline modifications, crystallite size, orientation), segmented polymers (micro- and nanophase-separated systems), nanocomposites with layered nanoparticles (clay: intercalation, exfoliation)
by means of different X-ray scattering methods: wide-angle scattering (WAXS), small-angle scattering (SAXS), reflectometry (XR) and grazing incidence small-angle scattering (GISAXS)
using the X-ray equipment of the IPF Dresden and in collaboration with synchrotron radiation facilities (Hasylab at DESY Hamburg / Germany: Beamline A2 and BW4, ESRF Grenoble / France: Beamline ID13) and the neutron facility GKSS Geesthacht / Germany (for neutron reflectivity)
in combination with on-line treatment of samples (temperature, stress, shearing)
computer simulation based on in-house collaboration (scattering patterns: molecular modeling, RIETVELD refinement; phase diagrams: mean field simulation, random phase approximation)
practical trainings for students (WAXS and SAXS on polymer systems)
participation in lectures at Technische Universität Dresden / Professorship of Physical Chemistry of Polymeric Materials
+49 (0)351 4658 493
+49 (0) 351 4658 281
djeh[at]ipfdd[dot]de
